Error message

  • Notice: Undefined variable: _SESSION in dial_widget_pr_publication_action() (line 140 of /var/www/html/drupal-7.54/sites/all/modules/dial/dial_widget/dial_widget_pr/dial_widget_pr.module).
  • Warning: array_key_exists() expects parameter 2 to be array, null given in dial_widget_pr_publication_action() (line 140 of /var/www/html/drupal-7.54/sites/all/modules/dial/dial_widget/dial_widget_pr/dial_widget_pr.module).

Investigation of metal-GaN and metal-Al,GaN contacts by XPS depth profiles and by electrical measurements

Bibliographic reference Dumont, Jacques ; Monroy, Eva ; Munoz, Elias ; Caudano, Roland ; Sporken, Robert. Investigation of metal-GaN and metal-Al,GaN contacts by XPS depth profiles and by electrical measurements. In: Journal of crystal growth, no. 230, p. 558-563 (2001)
Permanent URL