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Diode Laser Measurements of Line Strengths and Collisional Halfwidths in the ν1 Band of OCS at 298 and 200K

Bibliographic reference Bouanich, Jean-Pierre ; Blanquet, Ghislain ; Walrand, Jacques ; Courtoy, Charles. Diode Laser Measurements of Line Strengths and Collisional Halfwidths in the ν1 Band of OCS at 298 and 200K. In: Journal of Quantitative Spectroscopy and Radiative Tranfert, vol. 36, p. 295-306 (2003)
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