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XPS study of polymer chain conformation in amorphous and crystalline poly(ethyleneterephthalate) samples: is the sensitivity limit reached

Bibliographic reference Boulanger, Pierre ; Pireaux, Jean-Jacques ; Verbist, Jacques ; Delhalle, Joseph. XPS study of polymer chain conformation in amorphous and crystalline poly(ethyleneterephthalate) samples: is the sensitivity limit reached. In: J. Electron Spectroscopy, vol. 63, p. 53-73 (2002)
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